Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Analyzers
BA500 Series
The BA500 analyzers are high performance battery analyzers with charge and discharge capabilities. The analyzers connect to your computer via USB and the BA500WIN software program is used to control the analyzer and battery under test. This system has a fast data collection system allowing you to collect and view as much data as required. Once you collect this data you can graph, analyze & save it.
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PXIe-6545, 200 MHz, 32-Channel PXI Digital Waveform Instrument
780993-03
200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6545 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6545 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.
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PXI Programmable Resistor Card 2-Channel 2.5 Ohm to 8.19k Ohm - SPST
40-294-124
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Motorized Constant Loader
CLE-150 Series
When we measure the hardness of rubber test specimen etc. with durometer, we have the possibility to make an error for the result of the measurement. To make solution for such an important factor fo the error, CLE-150 Series is employed the motor driving system for the descent speed control, and then we could realize to measure the hardness of constant speed and constant pressure that is precise and reproducible.
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Test Port Cable, 1 Mm
11500J
The Keysight 11500J test port connector has a length of 16 cm and a frequency range of DC to 110 GHz. The 11500J integrates with the Keysight N5250A network analyzer and Keysight 8510XF network analyzer systems.
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PD Test Systems
1. Number of channels: 2/4 electric signal interfaces & 1 EXT interface 2. Sampling frequency: maximum 200MGa/s 3. Sampling precision: 12bit 4. Range: 0.1mV~20V 5. Range switch: 1mV, 2mV, 5mV, 10mV, 20mV, 50mV, 100mV, 200mV, 500mV, 1V, 2V, 5V 6. Frequency band range: 1Hz-60MHz 7. Range non-linear error: 5% 8. Range of capacitance for test object: 6pF~250µF 9. Power source mode: internal lithium cell / AC 220V 10. Display: 6.5 inches TFT LCD 11. Resolution: 640×480 12. PV: 4GB 13. Hard disk: 32G stiff disk used for storing the test data
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Pneumatic Zero Drop Tester
HIACC Engineering & Services Pvt. Ltd.
Designed as per ISTA packaging standard, the Pneumatic Zero Drop Test stand is used to assess the drop bearing capacity of the specimen during its transportation and handling process. The system is ideal for testing the specimen vulnerability around edges, surfaces and corners at different heights.
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System Instruments
bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
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Sapphire/SIC Wafer Flatness and Surface Appearance System
FM200
Sapphire/SIC wafer flatness and surface appearance system provide a previous surface flatness testing solution, though non-contract lighting testing to record the whole information of the surface, rapid and fast measurement for various of surfaces, line and all kinds of surface information.
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RF Bias Burn-In System
These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
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Safety Chamber, Hydrostatic Test
9901HTX-72x24x12
The 6 ft wide by 2 ft deep Hydrostatic Test Safety Chamber, when combined with one of our pump systems, provides a complete hydrostatic test system for testing hose and assemblies or other components requiring pressure testing.
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PXI 5W Programmable Resistor Module, 1-Channel, 1.5Ω to 472Ω
40-252-120
The 40-252-120 is a programmable resistor module with 1 channel which can be set between 1.5Ω and 472Ω with 0.125Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Multifunction Switch / Measure Unit, Modules
34980A Series
The Keysight 34980A multifunction switch / measure mainframe and modules provide functionality that is easy to set up and use. The 34980A helps you lower your cost of test and accelerate your test system integration and development.
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PXIe-2747, 2.7 GHz, Dual 8x1 PXI RF Multiplexer Switch Module
780587-47
PXIe, 2.7 GHz, Dual 8x1 PXI RF Multiplexer Switch Module—The PXIe‑2747 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 2.7 GHz in production test applications. The high channel count of the PXIe‑2747 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.
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PXI 5W Programmable Resistor Module, 2-Channel, 1Ω to 239Ω
40-252-113
The 40-252-113 is a programmable resistor module with 2 channels which can be set between 1Ω and 239Ω with 1Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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Single Bus 36-Channel 2A PCI Fault Insertion Switch
50-190-201
This PCI fault insertion switch range is available with 75, 64 or 36 channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. The Stimulus/Measurement to UUT path is suitable for supporting CAN and FlexRay bus systems.
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PCI Precision Resistor Card 6-Channel, 3Ω To 2.97MΩ
50-297-051
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Motor Quality Control Test Systems
SKF Condition Monitoring Center
These rack-style motor quality control units are rugged, field-proven systems for testing stators and armatures in high-volume manufacturing environments. They combine the most common electrical tests into an efficient automated solution.
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PXIe SSD Storage Unit
DM-4M.2-3U
The Big River™ DM-4M.2-3U PXI Express storage unit provides up to 3.8TB* of M.2 SSD storage capacity. With a PCIe x8 Gen3 host interface, the DM-4M.2 delivers high-speed data rates for sequential writes of 3.25GB/s** and sequential reads of 3.41GB/s** to PXI Express based systems. The single slot design of the DM-4M.2 increases the availability of valuable chassis space, allows for maximum storage flexibility. The DM-4M.2 complies with PCIe Gen3 protocol standards. The product is commonly used in the industrial control, test and measurement fields. The DM-4M.2 operates under Windows, Linux, Unix, Solaris and VxWorks.
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50 Pin Breakout Interface
VSI-Breakout-50
The VSI-Breakout-50 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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PXI 8x9 RF Matrix 250MHz 75 SMB
40-725-721
The 40-725 is an 8x9 RF Matrix Module suitable for switching frequencies up to 500MHz (50Ω version). The 40-725 is available in either 50Ω or 75Ω versions with SMB coaxial connectors. It is intended for the easy construction of high performance bidirectional matrix switching systems. Automatic Isolation Switches are located on all coaxial connections, these disconnect the matrix from the external test fixture maximizing isolation and RF performance.
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Exchangeable Test Fixture
MA 2111/D/H/S-5
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 9,30 kg
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Telecom Test Systems
4301 Series
The 4301 is designed to work with a standard arbitrary wave form generator or signal source that can be triggered. The system can be ordered with an optional Fluke 281 arbitrary waveform generator, which comes pre-programmed and integrated into the 4301 system. When equipped with the Fluke 281 option, the 4301 provides a complete solution for GR-1089 Section 10/ATIS-0600315.2007 testing.
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Advanced 3D Automatic X-Ray Inspection
V810 S2EX
V810 is "3D Automatic X-ray inspection System" that corresponds to the double side mounting SMT-PCB that is not able to be checked by a transmission-type X-ray machine. It has the ability to detect a wide range of defects, and It have 100% complete defect detection capability in the Hip-defective.And, it is the inspection machine of world's highest level that combines the ability of the ultra-fast test speed and the lowest false call positives further.
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Network Simulator
Fiber Lab 3200R
The Fiber Lab 3200R from M2 Optics is the latest innovation in a successful series of customized, packaged optical fiber platforms. Similar to the original Fiber Lab 3200 in terms of capacity and performance, this chassis has been re-designed specifically for users that wish to showcase their test fiber during system demonstrations, customer visits, and other common applications.
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Camera Testing
SWIR
CI systems' SWIR turn-key test stations simulates low light conditions to test special application cameras. An intuitive user friendly software carries out a variety of tests. The test stations are radiometrically calibrated to perform comprehensive SWIR tests.
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Bench Power Supply
E3640 Series
A combination of benchtop capabilities and system features, including GPIB and RS-232 interfaces, enables versatile solutions for tests that require moderate speed and precision.
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ETL Testing
Data is of utmost importance in digital systems. Protecting data, therefore, is of utmost importance. ETL refers to Extract, Transform, and Load. It supports the movement of data from its source to storage. With ETL testing we ensure that the data is not lost or corrupted during this movement. Huge volumes of data are collected in various formats and sources. The mapping process of these data is error-prone and can have quality issues.
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Fastest In-Circuit Test Platform
TestStation
Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
